{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T22:30:37Z","timestamp":1725402637740},"reference-count":2,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700680","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T17:55:58Z","timestamp":1228931758000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Overview of IEEE P1450.6.2 Standard; Creating CTL Model For Memory Test and Repair"],"prefix":"10.1109","member":"263","reference":[{"journal-title":"IEEE Standard 1450 Standard Test Interface Language (STIL)","year":"0","key":"2"},{"journal-title":"IEEE Standard 1450 6 Core Test Language (CTL)","year":"0","key":"1"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700680.pdf?arnumber=4700680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T16:06:46Z","timestamp":1489766806000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700680\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700680","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}