{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:47:19Z","timestamp":1725428839398},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700686","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-1","source":"Crossref","is-referenced-by-count":3,"title":["SoC Yield Improvement: Redundant Architectures to the Rescue?"],"prefix":"10.1109","author":[{"given":"J.","family":"Vial","sequence":"first","affiliation":[]},{"given":"A.","family":"Bosio","sequence":"additional","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"C.","family":"Landrault","sequence":"additional","affiliation":[]},{"given":"S.","family":"Pravossoudovitch","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.10"},{"journal-title":"Fault Tolerant Systems","year":"2007","author":"koren","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.19"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700686.pdf?arnumber=4700686","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T12:10:22Z","timestamp":1489752622000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700686\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700686","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}