{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T11:40:29Z","timestamp":1725450029962},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700695","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Diagnosis of Logic-to-chain Bridging Faults"],"prefix":"10.1109","author":[{"family":"Wei-Chih Liu","sequence":"first","affiliation":[]},{"family":"Wei-Lin Tsai","sequence":"additional","affiliation":[]},{"family":"Hsiu-Ting Lin","sequence":"additional","affiliation":[]},{"given":"J.C.-M.","family":"Li","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700695.pdf?arnumber=4700695","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T12:18:28Z","timestamp":1489753108000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700695\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700695","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}