{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:27:55Z","timestamp":1725470875258},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.5483610","type":"proceedings-article","created":{"date-parts":[[2010,6,18]],"date-time":"2010-06-18T19:13:48Z","timestamp":1276888428000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["DFT Implementationis for Striking the Right Balance between Test Cost and Test Quality for Automotive SOCs"],"prefix":"10.1109","author":[{"given":"Amit","family":"Dutta","sequence":"first","affiliation":[]},{"given":"Srinivasulu","family":"Alampaily","sequence":"additional","affiliation":[]},{"given":"Prasanth","family":"V","sequence":"additional","affiliation":[]},{"given":"Rubin","family":"Parekhji","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"ref10","article-title":"Code composer Studio – C6x Family"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297672"},{"journal-title":"Version Z-2007","article-title":"SoCBIST User Guide","year":"2007","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.76"},{"journal-title":"Version X-2007 12","article-title":"TeiraMAX User Guide","year":"2008","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.36"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/2.803640"},{"key":"ref17","first-page":"239","article-title":"Challenges of Burn-In and Impact to Test","author":"nigh","year":"2007","journal-title":"VLSI Test Symp"},{"key":"ref18","article-title":"A BIST Implementation Framework for Supporting Field Testability and Configurability in an Automotive SOC","author":"dutta","year":"2007","journal-title":"Workshop on Dependable and Secure Nanocomputing"},{"key":"ref19","first-page":"217","article-title":"Embedded Cores and System-on-Chip Testing","author":"parekhji","year":"2005","journal-title":"Advances in Electronic Testing Challenges and Methodologies"},{"year":"2008","key":"ref4","article-title":"TMS320DRH41x Technical Reference Manual"},{"year":"2006","key":"ref3","article-title":"TMS320DRA44x Technical Reference Manual"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297755"},{"key":"ref5","first-page":"1","article-title":"Where Is Car IC Testing Going","author":"okuda","year":"2007","journal-title":"Panel P6"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000029458.57095.bb"},{"key":"ref7","first-page":"927","article-title":"Hybrid Multi-site Testing at Manufacturing","author":"hashempour","year":"2003","journal-title":"Intl Test Conf"},{"year":"0","key":"ref2"},{"key":"ref1","first-page":"376","article-title":"There Is More Than Moore In Automotive","author":"hiller","year":"2007","journal-title":"Conference Automation"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.62"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386963"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.913191"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/05483610.pdf?arnumber=5483610","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T01:52:07Z","timestamp":1489888327000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5483610\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/test.2008.5483610","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}