{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T14:42:38Z","timestamp":1725460958695},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,11]]},"DOI":"10.1109\/test.2009.5355668","type":"proceedings-article","created":{"date-parts":[[2009,12,24]],"date-time":"2009-12-24T13:29:18Z","timestamp":1261661358000},"page":"1-7","source":"Crossref","is-referenced-by-count":12,"title":["Fast extended test access via JTAG and FPGAs"],"prefix":"10.1109","author":[{"given":"Sergei","family":"Devadze","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Artur","family":"Jutman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Igor","family":"Aleksejev","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raimund","family":"Ubar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"0","key":"13"},{"journal-title":"Evaluation Platform User Guide","first-page":"32","year":"2006","key":"11"},{"journal-title":"9-Mbit Pipelined Synchronous RAM Specification","year":"0","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805765"},{"journal-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture","year":"2001","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-0367-5"},{"year":"2008","key":"10"},{"journal-title":"Standard for Boundary-Scan Testing of Advanced Digital Networks","year":"2003","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271196"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297707"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2004.1347572"},{"year":"0","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805638"}],"event":{"name":"2009 IEEE International Test Conference (ITC)","start":{"date-parts":[[2009,11,1]]},"location":"Austin, TX, USA","end":{"date-parts":[[2009,11,6]]}},"container-title":["2009 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5348788\/5355529\/05355668.pdf?arnumber=5355668","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T23:33:34Z","timestamp":1489880014000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5355668\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,11]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/test.2009.5355668","relation":{},"subject":[],"published":{"date-parts":[[2009,11]]}}}