{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T18:31:49Z","timestamp":1725561109757},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,11]]},"DOI":"10.1109\/test.2009.5355721","type":"proceedings-article","created":{"date-parts":[[2009,12,24]],"date-time":"2009-12-24T18:29:18Z","timestamp":1261679358000},"page":"1-10","source":"Crossref","is-referenced-by-count":0,"title":["BIST scheme for RF VCOs allowing the self-correction of the cut"],"prefix":"10.1109","author":[{"given":"L.","family":"Testa","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Lapuyade","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Deval","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"O.","family":"Mazouffre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.L.","family":"Carbonero","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.B.","family":"Begueret","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/18\/2\/311"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2007.380978"},{"key":"14","article-title":"Introduction to microelectronic devices","author":"pulfrey","year":"0","journal-title":"Prentice Hall Series in Solid-State Physical Electronics"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.920354"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2004.1347842"},{"key":"3","article-title":"Built-in test of RF receivers using RF amplitude detectors","author":"zhang","year":"2007","journal-title":"13th International Mixed Signals Testing Workshop and 3 rd GHz\/Gbps Test Workshop June 18-20"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583963"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299246"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2008.4606333"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.870317"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.59"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2007.4511191"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-005-6360-x"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000023677.58861.81"},{"key":"8","first-page":"48","article-title":"Evaluation of test measures for low-cost LNA production testing","author":"tongbong","year":"2006","journal-title":"14th IFIP International Conference on Very Large Scale Integration"}],"event":{"name":"2009 IEEE International Test Conference (ITC)","start":{"date-parts":[[2009,11,1]]},"location":"Austin, TX, USA","end":{"date-parts":[[2009,11,6]]}},"container-title":["2009 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5348788\/5355529\/05355721.pdf?arnumber=5355721","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T03:40:44Z","timestamp":1489894844000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5355721\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,11]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/test.2009.5355721","relation":{},"subject":[],"published":{"date-parts":[[2009,11]]}}}