{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T08:42:25Z","timestamp":1725698545966},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699175","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["Complete testing of receiver jitter tolerance"],"prefix":"10.1109","author":[{"given":"Timothy D.","family":"Lyons","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"A Timestamping Method Using Reduced Cost ADC Hardware","author":"lyons","year":"2010","journal-title":"Proceedings IEEE Int Test Conference"},{"journal-title":"Has the copper interconnect hits its speed limit? Data rates are reaching the unlikely speed of 40 Gbps yet copper runs on","year":"2004","author":"bogatin","key":"ref3"},{"key":"ref10","first-page":"39","article-title":"Fibre Channel - Methodologies for Jitter Specification","year":"1999","journal-title":"REV 10"},{"key":"ref6","first-page":"6","article-title":"Universal Serial Bus 3.0 Specification","year":"2008","journal-title":"Rev 1 0"},{"journal-title":"SMBP-00019 Rev 1","article-title":"Jitter Fundamentals","year":"0","key":"ref5"},{"journal-title":"MAX3804 12 5Gbps Settable Receive Equalizer","first-page":"6","year":"2003","key":"ref8"},{"journal-title":"Revision 1 0RD","article-title":"PCI Express Architecture PCI ExpressTM Jitter Modeling","year":"2004","key":"ref7"},{"journal-title":"Intel® Pentium® 4 Processor in the 478-pin Package \/ Intel® 850 Chipset Family Platform Design Guide","first-page":"42","year":"2003","key":"ref2"},{"journal-title":"iT4036 Wideband Phase Delay","year":"2007","key":"ref9"},{"key":"ref1","first-page":"141","author":"burns","year":"2001","journal-title":"An Introduction to Mixed-Signal IC Test and Measurement"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699175.pdf?arnumber=5699175","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:53:53Z","timestamp":1490075633000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699175\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699175","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}