{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T12:05:58Z","timestamp":1725451558121},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699201","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-10","source":"Crossref","is-referenced-by-count":5,"title":["New tools and methodology for advanced parametric and defect structure test"],"prefix":"10.1109","author":[{"given":"Raphael","family":"Robertazzi","sequence":"first","affiliation":[]},{"given":"Louis","family":"Medina","sequence":"additional","affiliation":[]},{"given":"Ernesto","family":"Shiling","sequence":"additional","affiliation":[]},{"given":"Garry","family":"Moore","sequence":"additional","affiliation":[]},{"given":"Ronald","family":"Geiger","sequence":"additional","affiliation":[]},{"given":"Jiun-Hsin","family":"Liao","sequence":"additional","affiliation":[]},{"given":"John","family":"Williamson","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2009.4814600"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEMT.2004.1321674"},{"journal-title":"Agilent Product Note 5988-0687EN","article-title":"Ultra Low Current Measurement Technologies Employed in the Agilent 4073A Ultra Advanced Parametric Test System","year":"0","key":"ref10"},{"key":"ref6","first-page":"124","article-title":"Test Structures Utilizing High-Precision Fast Testing","author":"karthikeyan","year":"2009","journal-title":"Proc Int l Conf Microelectronic Test Structures"},{"key":"ref11","first-page":"138","article-title":"Classical Dynamics of Particles and Systems","author":"marion","year":"1970"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.2931030"},{"key":"ref8","first-page":"189","article-title":"Physics and Technology of Semiconductor Devices","author":"grove","year":"1967"},{"key":"ref7","first-page":"94","article-title":"Physics of Semiconductor Devices","author":"sze","year":"2007"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.165"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2024022"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.911351"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699201.pdf?arnumber=5699201","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:00:55Z","timestamp":1490076055000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699201\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699201","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}