{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,2]],"date-time":"2025-03-02T01:40:06Z","timestamp":1740879606882,"version":"3.38.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699216","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T20:20:08Z","timestamp":1295641208000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["A kernel-based approach for functional test program generation"],"prefix":"10.1109","author":[{"given":"Po-Hsien","family":"Chang","sequence":"first","affiliation":[]},{"given":"Li-C.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Jayanta","family":"Bhadra","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.70"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391536"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511809682"},{"key":"ref13","doi-asserted-by":"crossref","DOI":"10.7551\/mitpress\/4175.001.0001","author":"schlkopf","year":"2001","journal-title":"Learning With Kernels Support Vector Machines Regularization Optimization and Beyond"},{"journal-title":"Introduction to Data Mining","year":"2005","author":"tan","key":"ref14"},{"year":"0","key":"ref15"},{"key":"ref16","first-page":"419","article-title":"Text classification using string kernels","author":"lodhi","year":"2002","journal-title":"J Mach Learn Res"},{"key":"ref17","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-540-72903-7_1","article-title":"Bipartite graph matching for computing the edit distance of graphs","author":"riesen","year":"2007","journal-title":"Graph-Based Representations in Pattern Recognition"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/34.601251"},{"key":"ref4","first-page":"970","article-title":"A study in coverage-driven test generation","author":"benjamin","year":"1999","journal-title":"Proc DAC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1147\/sj.304.0527"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.162"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966701"},{"key":"ref8","article-title":"Coverage-directed test generation through automatic constraint extraction","author":"guzey","year":"2007","journal-title":"Proc IEEE HLDVT"},{"key":"ref7","article-title":"Coverage directed test generation for functional verification using Bayesian networks","author":"fine","year":"2003","journal-title":"Proc DAC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/217474.217542"},{"key":"ref1","article-title":"A Framework for constrained functional verification","author":"yuan","year":"2003","journal-title":"ICCAD"},{"key":"ref9","first-page":"1060","article-title":"Pattern selection for testing of deep sub-micron timing defects","author":"chao","year":"2004","journal-title":"DATE"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699216.pdf?arnumber=5699216","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,2]],"date-time":"2025-03-02T01:10:51Z","timestamp":1740877851000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699216\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699216","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}