{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,31]],"date-time":"2024-08-31T05:51:25Z","timestamp":1725083485908},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699231","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"source":"Crossref","is-referenced-by-count":18,"title":["Automatic classification of bridge defects"],"prefix":"10.1109","author":[{"given":"Jeffrey E.","family":"Nelson","sequence":"first","affiliation":[]},{"given":"Wing Chiu","family":"Tam","sequence":"additional","affiliation":[]},{"given":"R. D.","family":"Blanton","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior","author":"desineni","year":"2006","journal-title":"International Test Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/43.720323"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270853"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1990.111899"},{"key":"ref14","first-page":"303","article-title":"Constraints for Using IDDQ Testing to Detect CMOS Bridging Faults","author":"lee","year":"1991","journal-title":"VLSI Test Symposium"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1994.282680"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297692"},{"key":"ref17","author":"rokach","year":"2008","journal-title":"Data Mining with Decision Trees"},{"key":"ref18","year":"2004","journal-title":"Encounter®Test Manufacturing Edition User Guide"},{"key":"ref19","year":"2009","journal-title":"TetraMAX®User Guide"},{"key":"ref4","article-title":"Random Defect Characterization Sensitivity to Test, Diagnosis, and Volume","author":"nelson","year":"2008","journal-title":"GRC Techcon"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243807"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297715"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.896641"},{"key":"ref8","first-page":"501","article-title":"Advanced Scan Diagnosis Based Fault Isolation and Defect Identification for Yield Learning","author":"eddleman","year":"2005","journal-title":"Proc of International Symposium for Testing and Failure Analysis"},{"key":"ref7","article-title":"SLAT based Diagnosis","author":"huisman","year":"2005","journal-title":"Data Mining and Diagnosing IC Fails"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.117"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/43.700723"},{"key":"ref1","article-title":"International Technology Roadmap for Semiconductors","year":"2009","journal-title":"Executive Summary"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966689"},{"key":"ref22","first-page":"695","article-title":"A Neutral Netlist of 10 Combinational Benchmark Designs and a Special Translator in Fortran","author":"brglez","year":"1985","journal-title":"Proc of International Symposium on Circuits and Systems"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630096"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-4467-2"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/BF00058655"},{"key":"ref25","article-title":"R Development Core Team, R: A language and environment for statistical computing","year":"2005","journal-title":"R Foundation for Statistical Computing"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","location":"Austin, TX, USA","start":{"date-parts":[[2010,11,2]]},"end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699231.pdf?arnumber=5699231","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:50:20Z","timestamp":1490079020000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699231\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699231","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}