{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:13:25Z","timestamp":1730301205804,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699232","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-10","source":"Crossref","is-referenced-by-count":7,"title":["A high density small size RF test module for high throughput multiple resource testing"],"prefix":"10.1109","author":[{"given":"M.","family":"Kimishima","sequence":"first","affiliation":[]},{"given":"S.","family":"Mizuno","sequence":"additional","affiliation":[]},{"given":"T.","family":"Seki","sequence":"additional","affiliation":[]},{"given":"H.","family":"Takeuti","sequence":"additional","affiliation":[]},{"given":"H.","family":"Nagami","sequence":"additional","affiliation":[]},{"given":"H.","family":"Shirasu","sequence":"additional","affiliation":[]},{"given":"Y.","family":"Haraguti","sequence":"additional","affiliation":[]},{"given":"J.","family":"Okayasu","sequence":"additional","affiliation":[]},{"given":"M.","family":"Nakanishi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1966.1126145"},{"key":"ref11","first-page":"817","article-title":"A quantization noise pushing technique for ?? fractional-N frequency synthesizers","volume":"mtt 56","author":"yang","year":"2009","journal-title":"IEEE Trans Microwave Theory Tech"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2028927"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/75.877233"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1093\/ietele\/e88-c.10.1973"},{"key":"ref4","first-page":"1015","article-title":"Monolithic LTCC SiP transmitter for 60GHz wireless communication","author":"lee","year":"2005","journal-title":"2005 IEEE MTT-Symp Digest"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VETECF.2007.246"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2004.1336067"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2008.2008940"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1963.1125647"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2005.1516783"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2028920"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2006.1651116"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1964.1125809"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699232.pdf?arnumber=5699232","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:50:21Z","timestamp":1490079021000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699232\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699232","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}