{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:13:25Z","timestamp":1730301205470,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699233","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-9","source":"Crossref","is-referenced-by-count":1,"title":["RADPro: Automatic RF analyzer and diagnostic program generation tool"],"prefix":"10.1109","author":[{"given":"Sukeshwar","family":"Kannan","sequence":"first","affiliation":[]},{"given":"Bruce","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Ganesh","family":"Srinivasan","sequence":"additional","affiliation":[]},{"given":"Friedrich","family":"Taenzlar","sequence":"additional","affiliation":[]},{"given":"Richard","family":"Antley","sequence":"additional","affiliation":[]},{"given":"Craig","family":"Force","sequence":"additional","affiliation":[]},{"given":"Falah","family":"Mohammed","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Low Cost Test Technique for RF Interconnects in MCM Substrate","author":"kannan","year":"2009","journal-title":"IMAPS Advanced Technology Workshop on RF and Microwave Packaging"},{"key":"ref11","article-title":"Development of Automatic Program Generation Tool for Analog-Mixed Signal and RF Load Boards","author":"kannan","year":"2010","journal-title":"IEEE International Workshop on Reliability Aware System Design and Test"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386973"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1989.36230"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IEMT.1991.279832"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437629"},{"key":"ref3","article-title":"Circuit Analyzer and Test Generator (CATGEN) for Mixed-Signal Device Interface Boards","author":"sundar","year":"2008","journal-title":"IEEE VLSI Test Symposium"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/19.293410"},{"key":"ref5","first-page":"355","article-title":"Quantization and dither: A theoretical survey","volume":"40","year":"1992","journal-title":"Journal of audio engineering society"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.293456"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297655"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270864"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/26.634697"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699233.pdf?arnumber=5699233","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:50:22Z","timestamp":1490079022000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699233\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699233","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}