{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T15:59:00Z","timestamp":1780675140305,"version":"3.54.1"},"reference-count":32,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699237","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T20:20:08Z","timestamp":1295641208000},"page":"1-9","source":"Crossref","is-referenced-by-count":43,"title":["A diagnostic test generation system"],"prefix":"10.1109","author":[{"given":"Yu","family":"Zhang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Vishwani D.","family":"Agrawal","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2010.5550345"},{"key":"ref31","first-page":"226","article-title":"Diagnostic Test Generation for Sequential Circuits","author":"yu","year":"2000","journal-title":"Proc International Test Conf"},{"key":"ref30","first-page":"351","article-title":"Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation","author":"yu","year":"2003","journal-title":"Proc 21st IEEE VLSI Test Symp"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1991.185229"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355681"},{"key":"ref12","first-page":"75","article-title":"Compaction of Pass\/Fail-based Diagnostic Test Vectors for Combinational and Sequential Circuits","author":"higami","year":"2006","journal-title":"Proc ASPDAC"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556974"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.600264"},{"key":"ref15","article-title":"On the Generation of Test Patterns for Combinational Circuits","author":"lee","year":"1993"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"1048","DOI":"10.1109\/43.536711","article-title":"HOPE: An Efficient Parallel Fault Simulator for Synchronous Sequential Circuits","volume":"15","author":"lee","year":"1996","journal-title":"IEEE Trans Computer-Aided Design"},{"key":"ref17","first-page":"424","article-title":"Multiple-Fault Diagnosis based on Single-Fault Activation and Single-Output Observation","author":"lin","year":"2006","journal-title":"Proc Design Automation and Test in Europe (DATE)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.884486"},{"key":"ref19","author":"nelson","year":"1995","journal-title":"Digital Logic Circuit Analysis & Design"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1995.250077"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271091"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1329502"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.814241"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.748164"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/SSST.2008.4480230"},{"key":"ref5","article-title":"Essentials of Electronic Testing for Digital","author":"bushnell","year":"2000","journal-title":"Memory & Mixed-Signal VLSI Circuits"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.594835"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114000"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270849"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585232"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2003.1183128"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966643"},{"key":"ref22","author":"van rossum","year":"2009","journal-title":"Python Tutorial Release 2 6 3 docs python org Python Software Foundation"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1992.279361"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.121"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580105"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1093\/ietisy\/e91-d.3.675"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.33"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","location":"Austin, TX, USA","start":{"date-parts":[[2010,11,2]]},"end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699237.pdf?arnumber=5699237","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T18:44:56Z","timestamp":1497897896000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699237\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699237","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}