{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:36:55Z","timestamp":1761647815780,"version":"3.28.0"},"reference-count":49,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699239","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T20:20:08Z","timestamp":1295641208000},"page":"1-10","source":"Crossref","is-referenced-by-count":29,"title":["Systematic defect identification through layout snippet clustering"],"prefix":"10.1109","author":[{"given":"Wing Chiu","family":"Tam","sequence":"first","affiliation":[]},{"given":"Osei","family":"Poku","sequence":"additional","affiliation":[]},{"given":"R. D.","family":"Blanton","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","first-page":"423","article-title":"Mixture Models and EM","author":"bishop","year":"2006","journal-title":"Pattern Recognition and Machine Learning"},{"key":"ref38","first-page":"49","article-title":"On the Generalized Distance in Statistics","author":"mahalanobis","year":"1936","journal-title":"Proceedings of the National Institute of Science India"},{"article-title":"Pattern Recognition and Machine Learning","year":"2006","author":"bishop","key":"ref33"},{"key":"ref32","first-page":"752","article-title":"A Novel Type of Skeleton for Polygons","volume":"1","author":"aichholzer","year":"1995","journal-title":"Journal of Universal Computer Science"},{"year":"0","key":"ref31","article-title":"The Graphic Data System (GDS) II Format"},{"year":"0","key":"ref30"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1023\/A:1007612920971"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/1322432.1322434"},{"key":"ref35","first-page":"412","article-title":"Yield Learning with Layout-Aware Advanced Scan Diagnosis","author":"mekkoth","year":"2006","journal-title":"International Symposium for Testing and Failure Analysis"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/331499.331504"},{"year":"0","key":"ref28"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391568"},{"year":"0","key":"ref29"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382673"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386963"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041767"},{"key":"ref21","first-page":"1","article-title":"A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior","author":"desineni","year":"2006","journal-title":"International Test Conference"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114104"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894213"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1992.227780"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041766"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.37"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/el:19830156"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/34.868688"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387327"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISSM.2007.4446790"},{"key":"ref14","first-page":"69","article-title":"Utilizing Design Layout Information to Improve Efficiency of SEM Defect Review Sampling","author":"jansen","year":"2008","journal-title":"Advanced Semiconductor Manufacturing Conference"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1117\/12.814328"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"692505","DOI":"10.1117\/12.772867","article-title":"Automatic Hotspot Classification Using Pattern-Based Clustering","volume":"6925","author":"ma","year":"2008","journal-title":"Proc SPIE"},{"key":"ref17","first-page":"200","article-title":"Evaluating Yield and Testing Impact of Sub-Wavelength Lithography","author":"tam","year":"2010","journal-title":"VLSI Test Symposium"},{"key":"ref18","first-page":"281","article-title":"Some Methods for Classification and Analysis of Multivariate Observations","author":"macqueen","year":"1967","journal-title":"Proc Berkeley Symp on Math Statist and Prob"},{"year":"2001","key":"ref19","article-title":"The Optissimo User Manual"},{"key":"ref4","article-title":"Diagnosis-Enhanced Extraction of Defect Density and Size Distributions from Digital Logic ICs","author":"nelson","year":"2007","journal-title":"SRC Techcon"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2046448"},{"key":"ref6","first-page":"145","article-title":"Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement","author":"huaxing","year":"2007","journal-title":"European Test Symposium"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.49"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700589"},{"key":"ref7","first-page":"1","article-title":"A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis","author":"martin","year":"2006","journal-title":"International Test Conference"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630096"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.74"},{"key":"ref46","article-title":"Automatic DFM Rule Discovery through Layout Snippet Clustering","author":"tam","year":"2010","journal-title":"International Workshop on Design for Manufacturability and Yield"},{"key":"ref45","first-page":"69240k","article-title":"Enabling Technology Scaling with “in Production” Lithography Processes","author":"jhaveri","year":"2008"},{"key":"ref48","doi-asserted-by":"crossref","first-page":"65210","DOI":"10.1117\/12.716600","article-title":"DRC Plus: Augmenting Standard DRC with Pattern Matching on 2D Geometries","volume":"6521","author":"dai","year":"2007","journal-title":"Proc SPIE"},{"year":"0","key":"ref47","article-title":"The Diva Reference Manual"},{"key":"ref42","first-page":"274","article-title":"The Planar k-Means Problem is NP-Hard","author":"mahajan","year":"2009","journal-title":"International Workshop on Algorithms and Computation"},{"key":"ref41","first-page":"849","article-title":"On Spectral Clustering: Analysis and an Algorithm","volume":"14","author":"ng","year":"2001","journal-title":"Neural Information Processing Systems"},{"year":"2008","key":"ref44","article-title":"The Calibre CMPAnalyzer User Manual"},{"first-page":"1984","article-title":"The MATLAB Help Manual","year":"0","key":"ref43"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699239.pdf?arnumber=5699239","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T18:44:29Z","timestamp":1497897869000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699239\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":49,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699239","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}