{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:12:46Z","timestamp":1725534766770},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699240","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-10","source":"Crossref","is-referenced-by-count":7,"title":["Hard to find, easy to find systematics; just find them"],"prefix":"10.1109","author":[{"given":"Rao","family":"Desineni","sequence":"first","affiliation":[]},{"given":"Leah","family":"Pastel","sequence":"additional","affiliation":[]},{"given":"Maroun","family":"Kassab","sequence":"additional","affiliation":[]},{"given":"Robert","family":"Redburn","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387327"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1147\/rd.435.0899"},{"key":"ref12","article-title":"The Changing Role of Diagnosis in Yield Analysis","author":"eide","year":"2010","journal-title":"Test & Measurement World"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297715"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2010.5551475"},{"key":"ref15","article-title":"A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior","author":"desineni","year":"2006","journal-title":"Proc of the International Test Conference"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700589"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2010.5551472"},{"key":"ref18","first-page":"69","article-title":"Utilizing Design Layout Information to Improve Efficiency of SEM Defect Review Sampling","author":"jansen","year":"2008","journal-title":"Proceedings IEEE\/SEMI Advanced Semiconductor Manufacturing Conference and Workshop"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2007.375080"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271071"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/el:19830156"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.896641"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2003.1194504"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2004.1309549"},{"key":"ref7","article-title":"Identification of Systematic Yield Limiters in Complex ASICS Through Volume Structural TestFail Data Visualization and Analysis","author":"schuermyer","year":"2005","journal-title":"Proc of the International Test Conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.284.0461"},{"key":"ref1","article-title":"What is DFM & DFY and Why Should I Care ?","author":"raina","year":"2006","journal-title":"Proc of the International Test Conference"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.21"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699240.pdf?arnumber=5699240","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:23:55Z","timestamp":1490077435000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699240\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699240","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}