{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T09:53:14Z","timestamp":1725789194799},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699252","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-11","source":"Crossref","is-referenced-by-count":5,"title":["Characterizing mechanical performance of Board Level Interconnects for In-Circuit Test"],"prefix":"10.1109","author":[{"given":"Rosa","family":"Reinosa","sequence":"first","affiliation":[]},{"given":"Aileen","family":"Allen","sequence":"additional","affiliation":[]},{"given":"Elizabeth","family":"Benedetto","sequence":"additional","affiliation":[]},{"given":"Alan","family":"Mcallister","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2009.5074003"},{"journal-title":"IPC\/JEDEC-9702 Monotonic Bend Characterization of Board-Level Interconnects","year":"2004","key":"ref3"},{"journal-title":"IPC\/JEDEC-9704 Printed wiring board strain gage test guideline","year":"2005","key":"ref2"},{"journal-title":"IPC\/JEDEC 9707 Spherical Bend Test Method for Characterization of Board Level Interconnects","year":"2010","key":"ref1"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699252.pdf?arnumber=5699252","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:40:06Z","timestamp":1490074806000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699252\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699252","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}