{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:32:17Z","timestamp":1725499937805},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699254","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["STIL P1450.4: A standard for test flow specification"],"prefix":"10.1109","author":[{"given":"Jim","family":"O'Reilly","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ajay","family":"Khoche","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ernst","family":"Wahl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bruce","family":"Parnas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"2007","key":"ref4"},{"year":"2005","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557091"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639717"},{"journal-title":"Elements of STIL Principles and Applications of IEEE Std 1450","year":"2003","author":"maston","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743291"},{"year":"2002","key":"ref2"},{"year":"1996","key":"ref9"},{"year":"1999","key":"ref1"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699254.pdf?arnumber=5699254","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:40:07Z","timestamp":1490074807000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699254\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699254","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}