{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:04:50Z","timestamp":1729609490670,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699268","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-9","source":"Crossref","is-referenced-by-count":1,"title":["Leveraging existing power control circuits and power delivery architecture for variability measurement"],"prefix":"10.1109","author":[{"given":"Dhruva","family":"Acharyya","sequence":"first","affiliation":[]},{"given":"Kanak","family":"Agarwal","sequence":"additional","affiliation":[]},{"given":"Jim","family":"Plusquellic","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1147\/rd.504.0451"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/589434.589435"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2005.863244"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1117\/12.773184"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297743"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"50","DOI":"10.1109\/54.902822","article-title":"IC Diagnosis Using Multiple Supply Port IDDQs","volume":"18","author":"plusquellic","year":"0","journal-title":"IEEE Design & Test"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.102"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687479"},{"year":"0","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1149\/1.1420707"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1147\/rd.391.0189"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1117\/12.388263"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1116\/1.578990"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2006.1614285"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1117\/12.655131"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/66.843639"},{"key":"ref1","first-page":"750","article-title":"Impact of Local Partial Coherence Variations on Exposure Tool Performance","volume":"2440","author":"borodovsky","year":"1995","journal-title":"SPIE"},{"key":"ref9","first-page":"396","article-title":"Characterizing Process Variation in Nanometer CMOS","author":"agarwal","year":"2007","journal-title":"Design Automation Conf"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699268.pdf?arnumber=5699268","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T14:44:48Z","timestamp":1497883488000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699268\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699268","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}