{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:28:22Z","timestamp":1747805302700,"version":"3.28.0"},"reference-count":33,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699275","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-10","source":"Crossref","is-referenced-by-count":12,"title":["Low capture power at-speed test in EDT environment"],"prefix":"10.1109","author":[{"given":"Elham K.","family":"Moghaddam","sequence":"first","affiliation":[]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[]},{"given":"Sudhakar. M.","family":"Reddy","sequence":"additional","affiliation":[]},{"given":"Xijiang","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Nilanjan","family":"Mukherjee","sequence":"additional","affiliation":[]},{"given":"Mark","family":"Kassab","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.49"},{"key":"ref32","article-title":"Generation of Functional Broadside Tests for Transition Faults","author":"pomeranz","year":"2005","journal-title":"IEEE TCAD"},{"key":"ref31","first-page":"928","article-title":"On the generation of scan-based test sets with reachable states for testing under functional operation conditions","author":"pomeranz","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2008.196"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894297"},{"key":"ref11","first-page":"277","article-title":"Jump scan: a DFT technique for low power testing","author":"chiu","year":"2005","journal-title":"Proc VTS"},{"key":"ref12","first-page":"660","article-title":"A token scan architecture for low power testing","author":"huang","year":"2001","journal-title":"Proc ITC"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011129"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990291"},{"key":"ref15","first-page":"156","article-title":"On Reducing Peak Current and Power during Test","author":"li","year":"2005","journal-title":"ISVLSI"},{"key":"ref16","first-page":"25.1.1","article-title":"A novel scheme to reduce power supply noise for high-quality at-speed scan testing","author":"wen","year":"2007","journal-title":"Proc Int Test Conf"},{"key":"ref17","first-page":"1","article-title":"Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs","author":"remersaro","year":"2006","journal-title":"Proc of Intl Test Conf"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469580"},{"key":"ref19","first-page":"539","article-title":"New test data decompressor for low power applications","author":"czysz","year":"2007","journal-title":"Proc DAC"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271091"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966672"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.807895"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041775"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030440"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923416"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.736572"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041833"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966687"},{"key":"ref1","first-page":"237","article-title":"LFSR-coded test patterns for scan designs","author":"koenemann","year":"1991","journal-title":"Proc Eur Test Conf"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700585"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.829797"},{"key":"ref21","first-page":"1","article-title":"Low-capture-power test generation for scan-based at-speed testing","author":"wen","year":"2005","journal-title":"Proc ITC"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"313","DOI":"10.1049\/ip-cdt:20000537","article-title":"Minimization of power dissipation during test application in full-scan sequential circuits using primary input freezing","volume":"147","author":"nicolici","year":"2000","journal-title":"IEE Proc Computer and Digital Techniques"},{"key":"ref23","first-page":"488","article-title":"Efficient scan chain design for power minimization during scan testing under routing constraint","author":"bonhomme","year":"2003","journal-title":"Proc ITC"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/43.998630"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.800460"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699275.pdf?arnumber=5699275","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T14:44:57Z","timestamp":1497883497000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699275\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699275","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}