{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T00:07:26Z","timestamp":1756426046796,"version":"3.44.0"},"reference-count":3,"publisher":"IEEE","license":[{"start":{"date-parts":[[2010,11,1]],"date-time":"2010-11-01T00:00:00Z","timestamp":1288569600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2010,11,1]],"date-time":"2010-11-01T00:00:00Z","timestamp":1288569600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699300","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Scan chain securization though Open-Circuit Deadlocks"],"prefix":"10.1109","author":[{"given":"Michele","family":"Portolan","sequence":"first","affiliation":[{"name":"Bell Labs Ireland, Dublin, Ireland"}]},{"given":"Bradford","family":"Van Treuren","sequence":"additional","affiliation":[{"name":"Alcatel-Lucent Bell Labs, Murray Hill, NJ, USA"}]},{"given":"Suresh","family":"Goyal","sequence":"additional","affiliation":[{"name":"Bell Labs Ireland, Dublin, Ireland"}]}],"member":"263","reference":[{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355572"},{"year":"0","key":"ref2"},{"journal-title":"IEEE","article-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture","year":"2001","key":"ref1"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699300.pdf?arnumber=5699300","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,28]],"date-time":"2025-08-28T18:07:40Z","timestamp":1756404460000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5699300\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699300","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}