{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T22:51:00Z","timestamp":1725490260737},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699313","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T15:20:08Z","timestamp":1295623208000},"page":"1-1","source":"Crossref","is-referenced-by-count":2,"title":["Multiple fault activation cycle tests for transistor stuck-open faults"],"prefix":"10.1109","author":[{"given":"N.","family":"Devta-Prasanna","sequence":"first","affiliation":[]},{"given":"A.","family":"Gunda","sequence":"additional","affiliation":[]},{"given":"S. M.","family":"Reddy","sequence":"additional","affiliation":[]},{"given":"I.","family":"Pomeranz","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.74"},{"key":"ref3","first-page":"16","article-title":"ELF-Murphy Data on De-fects and Test Sets","author":"mccluskey","year":"0","journal-title":"Proc VTS"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.91"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011137"},{"key":"ref1","first-page":"1285","article-title":"Affordable and Effective Screening of Delay Defects in ASICs Using the In-line Resistance Fault Model","author":"benware","year":"0","journal-title":"Proc ITC"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699313.pdf?arnumber=5699313","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:49:34Z","timestamp":1490075374000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699313\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699313","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}