{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:23:17Z","timestamp":1729617797273,"version":"3.28.0"},"reference-count":31,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/test.2011.6139130","type":"proceedings-article","created":{"date-parts":[[2012,1,31]],"date-time":"2012-01-31T16:37:40Z","timestamp":1328027860000},"page":"1-8","source":"Crossref","is-referenced-by-count":2,"title":["P-PET: Partial pseudo-exhaustive test for high defect coverage"],"prefix":"10.1109","author":[{"given":"Abdullah","family":"Mumtaz","sequence":"first","affiliation":[]},{"given":"Michael E.","family":"Imhof","sequence":"additional","affiliation":[]},{"given":"Hans-Joachim","family":"Wunderlich","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"crossref","first-page":"242","DOI":"10.1145\/157485.164880","article-title":"an efficient partitioning strategy for pseudo-exhaustive testing","author":"srinivasan","year":"1993","journal-title":"30th ACM\/IEEE Design Automation Conference"},{"key":"ref30","first-page":"1960","article-title":"Auto-matic test point insertion for pseudo-random testing","author":"savaria","year":"1991","journal-title":"Proc of IEEE International Symposium on Circuits and Systems"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/EDAC.1990.136612"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TC.1983.1676175"},{"key":"ref12","first-page":"52","article-title":"Test set generation for pseudo-exhaustive BIST","year":"1986","journal-title":"Proc of International Conference on Computer Aided Design"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/FTCS.1988.5294"},{"key":"ref14","first-page":"19","article-title":"The pseudo-exhaustive test of sequential circuits","year":"1989","journal-title":"Proc of IEEE International Test Conference"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"46","DOI":"10.1109\/2.803640","article-title":"Nanometer technology effects on fault models for IC testing","volume":"32","author":"aitken","year":"2002","journal-title":"IEEE Computer Society Press"},{"key":"ref16","first-page":"176","article-title":"Reliability challenges for 45nm and beyond","author":"mcpherson","year":"2006","journal-title":"In Proc ACM Design Automation Conf"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/ATS.2010.24"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/DSNW.2010.5542612"},{"key":"ref19","first-page":"404","article-title":"An evaluation of pseudo random testing for detecting real defects","author":"tseng","year":"2001","journal-title":"Proc Of IEEE VLSI Test Symposium"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TC.1983.1676202"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1145\/944027.944032"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"1302","DOI":"10.1109\/12.5994","article-title":"Linear feedback shift register design using cyclic codes","volume":"37","year":"1988","journal-title":"Proc of IEEE Transactions on Computers"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/VTS.2009.43"},{"key":"ref6","first-page":"476","article-title":"An operationally efficient scheme for exhaustive test-pattern generation using linear codes","author":"vasanthavada","year":"1985","journal-title":"Proc of IEEE International Test Conference"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TC.1981.1675744"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/TEST.1996.557122"},{"key":"ref8","first-page":"148","article-title":"On the use of linear sums in exhaustive testing","author":"akers","year":"1985","journal-title":"Proceedings International Symposium on Fault-Tolerant Computing"},{"key":"ref7","first-page":"58","article-title":"Circuit segmentation for pseudo-exhaustive testing via simulated annealing","author":"shperling","year":"1987","journal-title":"Proc of IEEE International Test Conference"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"367","DOI":"10.1109\/TC.1986.1676772","article-title":"Condensed Linear Feedback Shift Register (LFSR) Testing A Pseudoexhaustive Test Technique","volume":"35","author":"wang","year":"1986","journal-title":"Proc of IEEE Transactions on Computers"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"541","DOI":"10.1109\/TC.1984.1676477","article-title":"Verification Testing - A Pseudoexhaustive Test Technique","author":"mccluskey","year":"1984","journal-title":"Proc of IEEE Transactions on Computers"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TEST.1990.114082"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/TEST.1995.529895"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/VTEST.1995.512620"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/TEST.2000.894222"},{"key":"ref24","first-page":"120","article-title":"Generation of vector patterns through reseeding of multiple-polynomial linear feedback shift registers","author":"hellebrand","year":"1992","journal-title":"Proc of IEEE International Test Conference"},{"key":"ref23","first-page":"289","article-title":"Stuck-at tuple-detection: A fault model based on stuck-at faults for improved defect coverage","author":"pomeranz","year":"2002","journal-title":"Proc Of IEEE VLSI Test Symposium"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"1175","DOI":"10.1109\/43.875312","article-title":"Automated synthesis of phase shifters for built-in self-test applications","volume":"19","author":"rajski","year":"2002","journal-title":"Proc of IEEE transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/18.6031"}],"event":{"name":"2011 IEEE International Test Conference (ITC)","start":{"date-parts":[[2011,9,20]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2011,9,22]]}},"container-title":["2011 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6132473\/6139126\/06139130.pdf?arnumber=6139130","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T09:36:53Z","timestamp":1497951413000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6139130\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/test.2011.6139130","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}