{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T19:27:52Z","timestamp":1725564472429},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/test.2011.6139132","type":"proceedings-article","created":{"date-parts":[[2012,1,31]],"date-time":"2012-01-31T21:37:40Z","timestamp":1328045860000},"page":"1-7","source":"Crossref","is-referenced-by-count":3,"title":["Clock-gating-aware low launch WSA test pattern generation for at-speed scan testing"],"prefix":"10.1109","author":[{"given":"Yi-Tsung","family":"Lin","sequence":"first","affiliation":[]},{"given":"Jiun-Lang","family":"Huang","sequence":"additional","affiliation":[]},{"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Preferred Fill: A scalable method to reduce capture power for scan based designs","author":"remersaro","year":"2006","journal-title":"International Test Conference"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TEST.2003.1271098"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TEST.2008.4700586"},{"year":"2008","author":"wang","journal-title":"System on Chip Test Architectures","key":"ref13"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/ASPDAC.2007.358089"},{"key":"ref15","first-page":"58","article-title":"A new A TPG method for efficient capture power reduction during scan testing","author":"wen","year":"2006","journal-title":"VLSI Test Symposium"},{"key":"ref16","article-title":"A novel scheme to reduce power supply noise for high-quality at-speed scan testing","author":"wen","year":"2007","journal-title":"International Test Conference"},{"key":"ref17","first-page":"527","article-title":"Critial-path-aware X-filling for effective IR-drop reduction in at-speed scan testing","author":"wen","year":"2007"},{"key":"ref18","first-page":"1019","article-title":"Low-capture-power test generation for scan-based at-speed testing","author":"wen","year":"2005","journal-title":"International Test Conference"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/ASPDAC.2010.5419834"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TCAD.2004.828110"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/VTS.2007.34"},{"year":"2009","author":"girard","journal-title":"Power-Aware Testing and Test Strategies for Low Power Devices","key":"ref6"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/ATS.2008.27"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TCAD.2003.822103"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ISVLSI.2005.53"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TEST.2009.5355649"},{"key":"ref1","first-page":"533","article-title":"Transistion delay fault test pattern generation considering supply voltage noise in a SoC design","author":"ahmed","year":"2007","journal-title":"Design Automation Conference"},{"key":"ref9","first-page":"1","article-title":"Power-aware test: Challenges and solutions","author":"ravi","year":"2007","journal-title":"International Test Conference"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/ICCAD.2010.5654130"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/ATS.2002.1181690"}],"event":{"name":"2011 IEEE International Test Conference (ITC)","start":{"date-parts":[[2011,9,20]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2011,9,22]]}},"container-title":["2011 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6132473\/6139126\/06139132.pdf?arnumber=6139132","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T13:41:51Z","timestamp":1490103711000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6139132\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/test.2011.6139132","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}