{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T06:07:28Z","timestamp":1725516448757},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/test.2011.6139141","type":"proceedings-article","created":{"date-parts":[[2012,1,31]],"date-time":"2012-01-31T16:37:40Z","timestamp":1328027860000},"page":"1-9","source":"Crossref","is-referenced-by-count":4,"title":["IEEE Std 1581 — A standardized test access methodology for memory devices"],"prefix":"10.1109","author":[{"given":"Heiko","family":"Ehrenberg","sequence":"first","affiliation":[]},{"given":"Bob","family":"Russell","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437625"},{"journal-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture-IEEE Std 1149 1–2001","year":"2001","key":"ref3"},{"journal-title":"A proof of concept for IEEE P1581","year":"0","author":"ehrenberg","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805780"},{"key":"ref11","article-title":"IEEE P1581 Receiver Test Enhancement","author":"russell","year":"0","journal-title":"Board Test Workshop (BTW) 2009"},{"key":"ref5","first-page":"439","article-title":"Static Component Interconnect Test Technology (SCITT): A new technology for assembly testing","year":"0","journal-title":"Proc 1999 Int Test Conf"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041863"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271118"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297707"},{"key":"ref9","article-title":"Emulation Circuitry Adds P1581to an Off-the-Shelf SRAM, Presentation slides","author":"russell","year":"0","journal-title":"Board Test Workshop (BTW) 2007"},{"year":"2011","key":"ref1"}],"event":{"name":"2011 IEEE International Test Conference (ITC)","start":{"date-parts":[[2011,9,20]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2011,9,22]]}},"container-title":["2011 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6132473\/6139126\/06139141.pdf?arnumber=6139141","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T09:47:24Z","timestamp":1490089644000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6139141\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/test.2011.6139141","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}