{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T15:06:20Z","timestamp":1742396780021},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/test.2011.6139142","type":"proceedings-article","created":{"date-parts":[[2012,1,31]],"date-time":"2012-01-31T21:37:40Z","timestamp":1328045860000},"page":"1-10","source":"Crossref","is-referenced-by-count":16,"title":["Multi-site test of RF transceivers on low-cost digital ATE"],"prefix":"10.1109","author":[{"given":"Ivo","family":"Kore","sequence":"first","affiliation":[]},{"given":"Ben","family":"Schuffenhauer","sequence":"additional","affiliation":[]},{"given":"Frank","family":"Demmerle","sequence":"additional","affiliation":[]},{"given":"Frank","family":"Neugebauer","sequence":"additional","affiliation":[]},{"given":"Gert","family":"Pfahl","sequence":"additional","affiliation":[]},{"given":"Dirk","family":"Rautmann","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583999"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387342"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699224"},{"key":"ref5","article-title":"Building an RF Source for Low-cost Testers Using an ADPLL Controlled by Texas Instruments Digital Signal Processor (DSP) TMS320C5402","author":"sylla","year":"2003","journal-title":"IEEE Proc IntI Test Conference"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1109\/ETS.2007.26","article-title":"FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests","author":"koren","year":"2007","journal-title":"Proc IEEE Eur Test Symp"},{"year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041873"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700601"}],"event":{"name":"2011 IEEE International Test Conference (ITC)","start":{"date-parts":[[2011,9,20]]},"location":"Anaheim, CA","end":{"date-parts":[[2011,9,22]]}},"container-title":["2011 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6132473\/6139126\/06139142.pdf?arnumber=6139142","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,2,5]],"date-time":"2020-02-05T21:52:48Z","timestamp":1580939568000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6139142\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/test.2011.6139142","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}