{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T04:27:49Z","timestamp":1729657669167,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/test.2011.6139146","type":"proceedings-article","created":{"date-parts":[[2012,1,31]],"date-time":"2012-01-31T21:37:40Z","timestamp":1328045860000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["Partial state monitoring for fault detection estimation"],"prefix":"10.1109","author":[{"given":"Yiwen","family":"Shi","sequence":"first","affiliation":[]},{"given":"Kantapon","family":"Kaewtip","sequence":"additional","affiliation":[]},{"given":"Wan-Chan","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Jennifer","family":"Dworak","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297674"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2006.12"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.30"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437646"},{"key":"ref14","first-page":"125","article-title":"Pentium Pro processor design for test and debug","volume":"15","year":"1998","journal-title":"IEEE Design & Test of Computers"},{"key":"ref15","doi-asserted-by":"crossref","DOI":"10.1145\/369028.369059","article-title":"Performance Analysis Using the MIPS R10000 Performance Counters","author":"zagha","year":"1996","journal-title":"Proceedings of the 1996 ACM\/IEEE Conference on Supercomputing"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EURMIC.2000.874631"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.7"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146916"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060209"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/54.57911"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1989.36235"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766684"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.814958"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594451"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766663"},{"key":"ref2","first-page":"885","article-title":"CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns","author":"yanjing","year":"2008","journal-title":"Design Automation and Test Europe"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469545"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639628"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2007.4392804"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5653788"},{"key":"ref24","article-title":"Analyzing the Effectiveness of Multiple-Detect Test Sets","author":"(shawn) blanton","year":"2003","journal-title":"International Test Conference"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/54.902820"}],"event":{"name":"2011 IEEE International Test Conference (ITC)","start":{"date-parts":[[2011,9,20]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2011,9,22]]}},"container-title":["2011 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6132473\/6139126\/06139146.pdf?arnumber=6139146","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T13:36:52Z","timestamp":1497965812000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6139146\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/test.2011.6139146","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}