{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T23:37:32Z","timestamp":1725406652679},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/test.2011.6139149","type":"proceedings-article","created":{"date-parts":[[2012,1,31]],"date-time":"2012-01-31T21:37:40Z","timestamp":1328045860000},"page":"1-8","source":"Crossref","is-referenced-by-count":1,"title":["On using address scrambling to implement defect tolerance in SRAMs"],"prefix":"10.1109","author":[{"given":"R. Alves","family":"Fonseca","sequence":"first","affiliation":[]},{"given":"L.","family":"Dilillo","sequence":"additional","affiliation":[]},{"given":"A.","family":"Bosio","sequence":"additional","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"S.","family":"Pravossoudovitch","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]},{"given":"N.","family":"Badereddine","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270863"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805645"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1987.295111"},{"journal-title":"Elementary Linear Algebra","year":"2005","author":"anton","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041760"},{"journal-title":"Advanced Test Methods for SRAMsEffective Solutions for Dynamic Fault Detection in Nanoscaled Technologies","year":"2009","author":"bosio","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966724"},{"key":"ref5","first-page":"1112","article-title":"Built in self repair for embedded high density SRAM","author":"kim","year":"1998","journal-title":"Proceedings of International Test Conference"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700555"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159742"},{"article-title":"Memory Array with Redundant Elements","year":"1983","author":"kressel","key":"ref2"},{"article-title":"Block Redundancy for Memory Array","year":"1981","author":"mc kenny","key":"ref1"},{"journal-title":"Digital System Testing and Testable Design","year":"1990","author":"abramovich","key":"ref9"}],"event":{"name":"2011 IEEE International Test Conference (ITC)","start":{"date-parts":[[2011,9,20]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2011,9,22]]}},"container-title":["2011 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6132473\/6139126\/06139149.pdf?arnumber=6139149","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T13:50:37Z","timestamp":1490104237000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6139149\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/test.2011.6139149","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}