{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T22:43:32Z","timestamp":1772577812586,"version":"3.50.1"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/test.2011.6139154","type":"proceedings-article","created":{"date-parts":[[2012,1,31]],"date-time":"2012-01-31T21:37:40Z","timestamp":1328045860000},"page":"1-10","source":"Crossref","is-referenced-by-count":9,"title":["A Software-Based Self-Test methodology for on-line testing of processor caches"],"prefix":"10.1109","author":[{"given":"G.","family":"Theodorou","sequence":"first","affiliation":[]},{"given":"N.","family":"Kranitis","sequence":"additional","affiliation":[]},{"given":"A.","family":"Paschalis","sequence":"additional","affiliation":[]},{"given":"D.","family":"Gizopoulos","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2007.4437427"},{"key":"ref13","first-page":"124","article-title":"Software-Based Self-Test Strategies for Memory Caches of RISC Processor Cores","author":"tuna","year":"2007","journal-title":"Proc of IEEE LATW"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.25"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.60"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.22"},{"key":"ref17","first-page":"418","article-title":"On the Generation of Functional Test Programs for the Cache Replacement Logic","author":"perez","year":"2009","journal-title":"Proc of IEEE Asian Test Symposium (ATS)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2010.5560214"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.166"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584083"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.895772"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894264"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250143"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.839486(410) 24"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.68"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000257"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297675"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2002.1029769"},{"key":"ref20","first-page":"1","article-title":"Testing of UltraSPARC T1 Microprocessor and its Challenges","author":"tan","year":"2006","journal-title":"Proc of International Test Conference (ITC)"},{"key":"ref22","first-page":"165","article-title":"RAMSES: a fast memory fault simulator","author":"wu","year":"1999","journal-title":"Proc Int Symp Defect Fault Tolerance in VLSI Systems"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1234529"}],"event":{"name":"2011 IEEE International Test Conference (ITC)","location":"Anaheim, CA, USA","start":{"date-parts":[[2011,9,20]]},"end":{"date-parts":[[2011,9,22]]}},"container-title":["2011 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6132473\/6139126\/06139154.pdf?arnumber=6139154","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T19:26:19Z","timestamp":1490124379000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6139154\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2011.6139154","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}