{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,10]],"date-time":"2025-05-10T06:46:38Z","timestamp":1746859598818,"version":"3.28.0"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401539","type":"proceedings-article","created":{"date-parts":[[2013,1,10]],"date-time":"2013-01-10T00:26:46Z","timestamp":1357777606000},"page":"1-9","source":"Crossref","is-referenced-by-count":6,"title":["On efficient silicon debug with flexible trace interconnection fabric"],"prefix":"10.1109","author":[{"given":"Xiao","family":"Liu","sequence":"first","affiliation":[]},{"given":"Qiang","family":"Xu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","first-page":"1338","article-title":"Trace signal selection for visibility enhancement in post-silicon validation","author":"liu","year":"2009","journal-title":"Proceedings Design Automation and Test in Europe (DATE)"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2011.14"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484858"},{"key":"15","first-page":"1045","article-title":"Simulation-based bug trace minimization with bmc-based refinement","author":"chang","year":"2005","journal-title":"Proceedings International Conference on Computer-Aided Design (ICCAD)"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003792"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2007.358111"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805821"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.823341"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437576"},{"key":"21","first-page":"1","article-title":"On multiplexed signal tracing for post-silicon debug","author":"liu","year":"2011","journal-title":"Proceedings Design Automation and Test in Europe (DATE)"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.50"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2010.5450503"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654123"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.51"},{"key":"25","article-title":"In vlsi test principles and architectures","author":"wang","year":"2006","journal-title":"Morgan Kaufmann"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560044"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364595"},{"key":"28","first-page":"555","article-title":"X-tracer: A reconfigurable x-tolerant trace compressor for silicon debug","volume":"2012","author":"liu","year":"0","journal-title":"Proc ACM\/IEEE Design Automation Conf (DAC)"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966662"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20050194"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.154"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146916"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030595"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630006"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.77"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2010.5419883"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.57"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.38"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401539.pdf?arnumber=6401539","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T18:21:24Z","timestamp":1490206884000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6401539\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401539","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}