{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T04:07:32Z","timestamp":1747886852171,"version":"3.41.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401540","type":"proceedings-article","created":{"date-parts":[[2013,1,10]],"date-time":"2013-01-10T00:26:46Z","timestamp":1357777606000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Adaptive test selection for post-silicon timing validation: A data mining approach"],"prefix":"10.1109","author":[{"given":"Ming","family":"Gao","sequence":"first","affiliation":[{"name":"Electrical and Computer Engineering Department, University of California, Santa Barbara, California 93106, U. S. A."}]},{"given":"Peter","family":"Lisherness","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering Department, University of California, Santa Barbara, California 93106, U. S. A."}]},{"given":"Kwang-Ting","family":"Cheng","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering Department, University of California, Santa Barbara, California 93106, U. S. A."}]}],"member":"263","reference":[{"year":"2011","article-title":"Intel faces 1bn bill after sandy bridge bug is laid bare","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/MDT.2008.77"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/ASPDAC.2011.5722197"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ASPDAC.2012.6165046"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TEST.1999.805629"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TEST.2001.966674"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/date.2006.243796"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/DAC.2002.1012689"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/HLDVT.2010.5496657"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/MDT.2008.79"},{"key":"ref11","first-page":"390","article-title":"Silicon speedpath measurement and feedback into eda flows","volume-title":"Design Automation Conference, 2007. DAC \u201907. 44th ACM\/IEEE","author":"Killpack"},{"issue":"2","key":"ref12","article-title":"System-level validation of the intel pentium m processor","volume":"7","author":"Silas","year":"2003","journal-title":"Intel Technology Journal"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/MDT.2008.61"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/VTS.2005.61"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/VTS.2009.53"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/ETSYM.2010.5512756"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/DAC.2007.375193"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1145\/775832.775906"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/VTEST.1999.766662"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1007\/BF00116251"},{"volume-title":"orpsocv 2","year":"2011","key":"ref21"},{"key":"ref22","first-page":"148","article-title":"Experiments with a new boosting algo-rithm","volume-title":"Machine Learning: Proceedings of the Thirteenth International Conference","author":"Freund"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401540.pdf?arnumber=6401540","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:23:06Z","timestamp":1747804986000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6401540\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401540","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}