{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T12:15:27Z","timestamp":1767183327272},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401548","type":"proceedings-article","created":{"date-parts":[[2013,1,9]],"date-time":"2013-01-09T19:26:46Z","timestamp":1357759606000},"page":"1-10","source":"Crossref","is-referenced-by-count":23,"title":["On pinpoint capture power management in at-speed scan test generation"],"prefix":"10.1109","author":[{"given":"X.","family":"Wen","sequence":"first","affiliation":[]},{"given":"Y.","family":"Nishida","sequence":"additional","affiliation":[]},{"given":"K.","family":"Miyase","sequence":"additional","affiliation":[]},{"given":"S.","family":"Kajihara","sequence":"additional","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"M.","family":"Tehranipoor","sequence":"additional","affiliation":[]},{"given":"L.-T.","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139145"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687420"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2009.5118182"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271091"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.80"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1145\/127601.127729"},{"key":"15","first-page":"67","article-title":"On capture power-aware test data compression for scan-based testing","author":"li","year":"2008","journal-title":"Proc ICCAD"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030440"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"2011","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297694"},{"key":"11","first-page":"265","article-title":"On low-capture-power test generation for scan testing","author":"wen","year":"2005","journal-title":"Proc VTS"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783778"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105302"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.261012"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.822103"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584088"},{"key":"1","article-title":"Delay testing","author":"walker","year":"2007","journal-title":"System-on-Chip Test Architectures Nanometer Design for Testability"},{"key":"10","first-page":"250","article-title":"Atpg for heat dissipation minimization during test application","author":"wang","year":"1994","journal-title":"Proc ITC"},{"key":"7","article-title":"Power-aware test: Challenges and solutions","author":"ravi","year":"2007","journal-title":"Proc ITC Lecture"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966687"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.52"},{"journal-title":"Power-Aware Testing and Test Strategies for Low Power Devices","year":"2009","author":"girard","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.45"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2008.274"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401548.pdf?arnumber=6401548","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T15:24:45Z","timestamp":1490196285000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6401548\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401548","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}