{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T04:07:27Z","timestamp":1747886847399,"version":"3.41.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401554","type":"proceedings-article","created":{"date-parts":[[2013,1,10]],"date-time":"2013-01-10T00:26:46Z","timestamp":1357777606000},"page":"1-10","source":"Crossref","is-referenced-by-count":1,"title":["Event-driven framework for configurable runtime system observability for SOC designs"],"prefix":"10.1109","author":[{"given":"Jong Chul","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Arizona, Tucson, AZ"}]},{"given":"Faycel","family":"Kouteib","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Arizona, Tucson, AZ"}]},{"given":"Roman","family":"Lysecky","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Arizona, Tucson, AZ"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146916"},{"key":"ref2","first-page":"569","article-title":"Leveraging Pre-Silicon Verification Resources for the Post-Silicon Validation of the IBM POWER 7 Processor","volume-title":"Design Automation Conference (DAC)","author":"Adir"},{"journal-title":"CoreSight Components Technical Reference Manual","key":"ref3"},{"journal-title":"Embedded Trace Macrocell Architecture Specification","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1085130.1085145"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2001.915206"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700594"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484892"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.35"},{"key":"ref10","article-title":"Integrating On Chip Debug Instrumentation and EDA Verification Tools","author":"Leatherman","year":"2005","journal-title":"DesignCon East"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MP.2005.1405795"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ECBS.2011.13"},{"key":"ref13","first-page":"352","article-title":"Interconnection Fabric Design for Tracing Signals in Post-Silicon Validation","volume-title":"Design Automation Conference (DAC)","author":"Liu"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1329364"},{"key":"ref15","first-page":"116","article-title":"OWL: Next Generation System Monitoring","volume-title":"Conference on Computing Frontiers","author":"Shultz"},{"issue":"3","key":"ref16","first-page":"37","volume":"19","author":"Vermeulen","year":"2002","journal-title":"IEEE Design & Test of Computers"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-sen:20060076"},{"journal-title":"MicroBlaze Processor Reference Guide","key":"ref18"},{"journal-title":"as and Libraries Document Collection","key":"ref19"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/APASIC.2004.1349442"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401554.pdf?arnumber=6401554","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:14:41Z","timestamp":1747804481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6401554\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401554","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}