{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:32:24Z","timestamp":1725499944912},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401557","type":"proceedings-article","created":{"date-parts":[[2013,1,9]],"date-time":"2013-01-09T19:26:46Z","timestamp":1357759606000},"page":"1-7","source":"Crossref","is-referenced-by-count":4,"title":["Improving test compression by retaining non-pivot free variables in sequential linear decompressors"],"prefix":"10.1109","author":[{"given":"Sreenivaas S.","family":"Muthyala","sequence":"first","affiliation":[]},{"given":"Nur A.","family":"Touba","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","article-title":"Vlsi test principles and architectures: Design for testability","author":"wang","year":"2006","journal-title":"Morgan Kaufmann"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355554"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831584"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139170"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297662"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2004.1347615"},{"key":"10","first-page":"180","article-title":"Low power test data compression based on LFSR reseeding","author":"lee","year":"2004","journal-title":"Proceedings - IEEE International Conference on Computer Design VLSI in Computers and Processors"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966711"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"5","first-page":"237","article-title":"Lfsr-coded test patterns for scan designs","author":"ko?nemann","year":"1991","journal-title":"Proc of European Test Conference"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699227"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299229"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041775"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401557.pdf?arnumber=6401557","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T14:09:43Z","timestamp":1490191783000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6401557\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401557","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}