{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,4]],"date-time":"2025-09-04T13:37:27Z","timestamp":1756993047057,"version":"3.28.0"},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401559","type":"proceedings-article","created":{"date-parts":[[2013,1,9]],"date-time":"2013-01-09T19:26:46Z","timestamp":1357759606000},"page":"1-9","source":"Crossref","is-referenced-by-count":7,"title":["Low power programmable PRPG with enhanced fault coverage gradient"],"prefix":"10.1109","author":[{"given":"J.","family":"Solecki","sequence":"first","affiliation":[]},{"given":"J.","family":"Tyszer","sequence":"additional","affiliation":[]},{"given":"G.","family":"Mrugalski","sequence":"additional","affiliation":[]},{"given":"N.","family":"Mukherjee","sequence":"additional","affiliation":[]},{"given":"J.","family":"Rajski","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2002.1106816"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/43.238040"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231071"},{"key":"15","first-page":"138","article-title":"Low-transition lfsr for bist-based applications","author":"nourani","year":"2005","journal-title":"Proc ATS"},{"key":"16","first-page":"347","article-title":"Generation of correlated random patterns for the complete testing of synthe\ufffdsized multi-level circuits","author":"pateras","year":"1991","journal-title":"Proc DAC"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114081"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700574"},{"key":"11","first-page":"230","article-title":"A new low power test pattern generator using a transition monitoring window based on BIST architecture","volume":"2005","author":"kim","year":"2005","journal-title":"Proceedings of the Asian Test Symposium"},{"key":"12","first-page":"355","article-title":"Adaptive low shift power test pattern generator","author":"lin","year":"2010","journal-title":"Proc ATS"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/IADCC.2009.4809027"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/ICECTECH.2011.5942075"},{"key":"22","first-page":"2","article-title":"Transformed pseu\ufffddo-random patterns for bist","author":"touba","year":"1995","journal-title":"Proc VTS"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/43.918212"},{"key":"24","doi-asserted-by":"crossref","first-page":"834","DOI":"10.1109\/TEST.2002.1041837","article-title":"Generation of low power dissipation and high fault coverage patterns for scan-based BIST","author":"wang","year":"2002","journal-title":"IEEE International Test Conference (TC)"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.1013896"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855927"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/43.55187"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569803"},{"key":"29","first-page":"133","article-title":"Power reduction in test-per- scan bist","author":"zhang","year":"2000","journal-title":"Proc OLTW"},{"key":"3","first-page":"417","article-title":"A novel pattern gen\ufffderator for near-perfect fault-coverage","author":"chatterjee","year":"1995","journal-title":"Proc VTS"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.842885"},{"key":"10","first-page":"49","article-title":"Low power serial built-in self-test","author":"hertwig","year":"1998","journal-title":"Proc ETS"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1049\/el:20083481"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297695"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923454"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766696"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805616"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843823"},{"journal-title":"Power-Aware Testing and Test Strategies for Low Power De\ufffdvices","year":"0","author":"girard","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033791"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401559.pdf?arnumber=6401559","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T01:26:00Z","timestamp":1498008360000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6401559\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401559","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}