{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T04:07:27Z","timestamp":1747886847890,"version":"3.41.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401562","type":"proceedings-article","created":{"date-parts":[[2013,1,10]],"date-time":"2013-01-10T00:26:46Z","timestamp":1357777606000},"page":"1-7","source":"Crossref","is-referenced-by-count":2,"title":["Calibration of a flexible high precision Power-On Reset during production test"],"prefix":"10.1109","author":[{"given":"Gerald","family":"Hilber","sequence":"first","affiliation":[{"name":"Institute for Integrated Circuits, Johannes Kepler University, Linz, Austria"}]},{"given":"Dominik","family":"Gruber","sequence":"additional","affiliation":[{"name":"Institute for Integrated Circuits, Johannes Kepler University, Linz, Austria"}]},{"given":"Michael","family":"Sams","sequence":"additional","affiliation":[{"name":"Institute for Integrated Circuits, Johannes Kepler University, Linz, Austria"}]},{"given":"Timm","family":"Ostermann","sequence":"additional","affiliation":[{"name":"Institute for Integrated Circuits, Johannes Kepler University, Linz, Austria"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2006.258175"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0167-9260(88)90044-2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1973.1050378"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.1970.1154790"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1974.1050532"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/NORCHP.2011.6126717"},{"key":"ref7","article-title":"Mehrstufig kalib-rierbare temperaturstabile Referenz","author":"Gruber","year":"2011","journal-title":"Zuverlaessigkeit und Entwurf (ITG-FB 231)"},{"key":"ref8","article-title":"A Voltage Reference with On-Chip Trimmable Temperature Coefficient and Offset Voltage","author":"Gruber","year":"2011","journal-title":"MIXDES 2011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2010.5515252"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/NORCHP.2007.4481077"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401562.pdf?arnumber=6401562","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:16:11Z","timestamp":1747804571000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6401562\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401562","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}