{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,31]],"date-time":"2025-05-31T11:21:47Z","timestamp":1748690507470},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401570","type":"proceedings-article","created":{"date-parts":[[2013,1,10]],"date-time":"2013-01-10T00:26:46Z","timestamp":1357777606000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Capacitive sensing testability in complex memory devices"],"prefix":"10.1109","author":[{"given":"Kenneth P.","family":"Parker","sequence":"first","affiliation":[]}],"member":"263","reference":[{"journal-title":"2G bits DDR3 SDRAM EDJ2108DEBG","year":"2011","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700580"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699259"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355662"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-0367-5"},{"year":"0","key":"5"},{"journal-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture","year":"2001","key":"4"},{"year":"0","key":"8"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401570.pdf?arnumber=6401570","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T18:09:51Z","timestamp":1490206191000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6401570\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401570","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}