{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T20:40:25Z","timestamp":1725396025790},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401572","type":"proceedings-article","created":{"date-parts":[[2013,1,9]],"date-time":"2013-01-09T19:26:46Z","timestamp":1357759606000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["Board assisted-BIST: Long and short term solutions for testpoint erosion — Reaching into the DFx toolbox"],"prefix":"10.1109","author":[{"given":"Zoe","family":"Conroy","sequence":"first","affiliation":[]},{"given":"James","family":"Grealish","sequence":"additional","affiliation":[]},{"given":"Harrison","family":"Miles","sequence":"additional","affiliation":[]},{"given":"Anthony J.","family":"Suto","sequence":"additional","affiliation":[]},{"given":"Alfred","family":"Crouch","sequence":"additional","affiliation":[]},{"given":"Skip","family":"Meyers","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Design for Test for Digital IC's and Embedded Core Systems","year":"1999","author":"crouch","key":"15"},{"year":"0","key":"13"},{"year":"0","key":"14"},{"year":"0","key":"11"},{"year":"0","key":"12"},{"year":"2009","key":"3"},{"year":"0","key":"2"},{"year":"0","key":"1"},{"year":"0","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355662"},{"key":"6","first-page":"33","article-title":"Power to the opens","author":"suto","year":"2010","journal-title":"Test & Measurement World"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355673"},{"year":"0","key":"4"},{"year":"0","key":"9"},{"year":"0","key":"8"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401572.pdf?arnumber=6401572","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T14:10:00Z","timestamp":1490191800000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6401572\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401572","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}