{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T07:10:05Z","timestamp":1747811405413,"version":"3.41.0"},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401584","type":"proceedings-article","created":{"date-parts":[[2013,1,10]],"date-time":"2013-01-10T00:26:46Z","timestamp":1357777606000},"page":"1-10","source":"Crossref","is-referenced-by-count":7,"title":["FALCON: Rapid statistical fault coverage estimation for complex designs"],"prefix":"10.1109","author":[{"given":"Shahrzad","family":"Mirkhani","sequence":"first","affiliation":[{"name":"Computer Engineering Research Center, The University of Texas at Austin, Austin, TX 78712"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacob A.","family":"Abraham","sequence":"additional","affiliation":[{"name":"Computer Engineering Research Center, The University of Texas at Austin, Austin, TX 78712"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toai","family":"Vo","sequence":"additional","affiliation":[{"name":"Cisco Systems Inc., San Jose, CA 95134"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongshin","family":"Jun","sequence":"additional","affiliation":[{"name":"Cisco Systems Inc., San Jose, CA 95134"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bill","family":"Eklow","sequence":"additional","affiliation":[{"name":"Cisco Systems Inc., San Jose, CA 95134"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544389"},{"key":"ref2","first-page":"189","volume":"5","author":"Agrawal","year":"1981","journal-title":"Sampling techniques for determining fault coverage in lsi circuits"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/54.57911"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.89"},{"journal-title":"Verifault-xl user\u2019s guide","author":"Bhatnagar","key":"ref5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437635"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639630"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1991.208163"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519750"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292302"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1995.512098"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/62882.62939"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556958"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/GLSV.1999.757387"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1986.1586142"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519695"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894231"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/157485.165011"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/2.544235"},{"key":"ref20","first-page":"198","article-title":"Proofs: A fast","volume":"11","author":"Niermann","year":"1992","journal-title":"IEEE"},{"volume-title":"Ivm processor","key":"ref21","article-title":"U. of Illinois at Urbana-Champaign"},{"volume-title":"Opencores webpage","key":"ref22"},{"first-page":"590","volume-title":"Test Conference, 2002. Proceedings. International","author":"Parvathala","key":"ref23"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299223"},{"key":"ref25","first-page":"272","article-title":"Hiscoap: a hierarchical testability analysis tool","author":"Ravi kumar","year":"1995","journal-title":"Published by the IEEE Computer Society"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1995.485336"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/BF00137390"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.1962.5219384"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894305"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041902"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/FPGA.1995.477416"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401584.pdf?arnumber=6401584","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:30:30Z","timestamp":1747809030000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6401584\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401584","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}