{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:13:45Z","timestamp":1730301225874,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401586","type":"proceedings-article","created":{"date-parts":[[2013,1,9]],"date-time":"2013-01-09T19:26:46Z","timestamp":1357759606000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["Functional test content optimization for peak-power validation — An experimental study"],"prefix":"10.1109","author":[{"given":"Vinayak","family":"Kamath","sequence":"first","affiliation":[]},{"given":"Wen","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Nik","family":"Sumikawa","sequence":"additional","affiliation":[]},{"given":"Li-C.","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"17"},{"key":"15","volume":"5","author":"lavrac","year":"2004","journal-title":"Subgroup Discovery with CN2-SD"},{"journal-title":"OpenSPARC T2 Core Microarchitecture Specification(Rev A)","year":"2007","key":"16"},{"key":"13","article-title":"A kernel-based approach for functional test program generation","volume":"11","author":"chang","year":"2011","journal-title":"ITC"},{"journal-title":"Data Mining Concepts and Techniques","year":"2006","author":"han","key":"14"},{"key":"11","first-page":"399406","article-title":"Why discretization works for naive bayesian classifiers","author":"hsu","year":"2000","journal-title":"Proc 17th International Conf on Machine Learning Morgan Kaufmann"},{"key":"12","article-title":"Online selection of effective functional test programs based on novelty detection","volume":"10","author":"chang","year":"2010","journal-title":"ICCAD"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146916"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837278"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837280"},{"key":"10","first-page":"138","article-title":"Increasing the efficiency of simulation-based functional verification through unsupervised support vector analysis. Computer-aided design of integrated circuits and systems","volume":"29","author":"guzey","year":"2010","journal-title":"IEEE Transactions"},{"key":"7","article-title":"Transaction based pre-to-ost silicon validation","volume":"11","author":"singerman","year":"0","journal-title":"DAC"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024856"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763252"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751878"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391536"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024857"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401586.pdf?arnumber=6401586","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T14:13:46Z","timestamp":1490192026000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6401586\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401586","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}