{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T07:10:05Z","timestamp":1747811405977,"version":"3.41.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/test.2012.6401592","type":"proceedings-article","created":{"date-parts":[[2013,1,10]],"date-time":"2013-01-10T00:26:46Z","timestamp":1357777606000},"page":"1-9","source":"Crossref","is-referenced-by-count":2,"title":["RNA: Advanced phase tracking method for digital waveform reconstruction"],"prefix":"10.1109","author":[{"given":"Takashi","family":"Ito","sequence":"first","affiliation":[{"name":"Rohde & Schwarz Japan, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hideo","family":"Okawara","sequence":"additional","affiliation":[{"name":"Advantest Corporation, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinlei","family":"Liu","sequence":"additional","affiliation":[{"name":"Advantest America Inc. Cupertino, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","first-page":"172","volume-title":"An Engineer\u2019s Guide to Automated Testing of High-speed Interfaces","author":"Moreira","year":"2010"},{"key":"ref2","first-page":"42","volume-title":"An Engineer\u2019s Guide to Automated Testing of High-speed Interfaces","author":"Moreira","year":"2010"},{"article-title":"Data Analysis on PinScale3600","volume-title":"VOICE (User Group Meeting) Presentation, Agilent Technology","author":"Liu","key":"ref3"},{"volume-title":"PCI-Express Protocol Testing on 93000 SOC PinScale3600","year":"2008","author":"McPheeters","key":"ref4"},{"volume-title":"IO Interface Characterization \u2013 An Application of DNA Tool","year":"2010","author":"Liu","key":"ref5"},{"volume-title":"DSP \u2013 Based Testing Fundamentals \u2013 Coherent Condition, \u2013 Under-sampling","year":"2008","author":"Okawara","key":"ref6"},{"journal-title":"HDMI Licensing, LLC","article-title":"High-Definition Multimedia Interface Specification Version 1.3","year":"2006","key":"ref7"},{"article-title":"Who is Fourier?: a mathematical adventure","volume-title":"Language Research Foundation","year":"1995","key":"ref8"}],"event":{"name":"2012 IEEE International Test Conference (ITC)","start":{"date-parts":[[2012,11,5]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2012,11,8]]}},"container-title":["2012 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387511\/6401510\/06401592.pdf?arnumber=6401592","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:30:29Z","timestamp":1747809029000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6401592\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/test.2012.6401592","relation":{},"subject":[],"published":{"date-parts":[[2012,11]]}}}