{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T03:28:17Z","timestamp":1725766097093},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/test.2013.6651904","type":"proceedings-article","created":{"date-parts":[[2013,11,11]],"date-time":"2013-11-11T19:57:38Z","timestamp":1384199858000},"page":"1-8","source":"Crossref","is-referenced-by-count":13,"title":["SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states"],"prefix":"10.1109","author":[{"given":"Ben","family":"Niewenhuis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R. D.","family":"Blanton","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mudit","family":"Bhargava","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ken","family":"Mai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"IEEE Std 1149 1-2001","article-title":"IEEE standard test access port and boundary-scan architecture","year":"2001","key":"19"},{"key":"17","first-page":"626","article-title":"ScanPUF: Robust ultralow overhead puf using scan chain","author":"zheng","year":"2013","journal-title":"Asia and South Pacific Design Automation Conference"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1016\/B978-012373973-5.50007-3"},{"key":"15","article-title":"Physically unclonable functions: Constructions","author":"maes","year":"2012","journal-title":"Properties and Applications"},{"key":"16","first-page":"283","article-title":"PUFs: Myth, fact or busted? A security evaluation of physically unclonable functions (pufs) cast in silicon","author":"katzenbeisser","year":"2012","journal-title":"14th International Conference on Cryptographic Hardware and Embedded Systems"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.25"},{"key":"14","article-title":"Achieving system-level counterfeit protection through scan-puf","author":"blanton","year":"2010","journal-title":"CSSI Report No 10-02"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1867635.1867644"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2012.6224314"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-8080-9_4"},{"key":"2","article-title":"Physical one-way functions","author":"pappu","year":"2001","journal-title":"Massachusetts Institute of Technology"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2012.6330625"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2007.4380646"},{"key":"6","first-page":"9","article-title":"Physical unclonable functions for device authentication and secure key generation","author":"suh","year":"2007","journal-title":"40th Design Automation Conference"},{"key":"5","first-page":"369","article-title":"Read-Proof hardware from protective coatings","author":"tuyls","year":"2006","journal-title":"8th International Conference on Cryptographic Hardware and Embedded Systems"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2012.6341361"},{"key":"9","first-page":"1","article-title":"Intrinsic pufs from flip-flops on reconfigurable devices","author":"maes","year":"2008","journal-title":"3rd Benelux Workshop on Information and System Security"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513106"}],"event":{"name":"2013 IEEE International Test Conference (ITC)","start":{"date-parts":[[2013,9,6]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2013,9,13]]}},"container-title":["2013 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6646057\/6651860\/06651904.pdf?arnumber=6651904","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T02:25:49Z","timestamp":1490235949000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6651904\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2013.6651904","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}