{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T09:06:35Z","timestamp":1726045595169},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/test.2013.6651914","type":"proceedings-article","created":{"date-parts":[[2013,11,11]],"date-time":"2013-11-11T19:57:38Z","timestamp":1384199858000},"source":"Crossref","is-referenced-by-count":6,"title":["On the generation of compact test sets"],"prefix":"10.1109","author":[{"given":"Amit","family":"Kumar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sudhakar M.","family":"Reddy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chen","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/43.21822"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544389"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1145\/62882.62929"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1147\/rd.104.0278"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2126574"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699226"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/43.265676"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/43.238040"},{"key":"1","first-page":"260","article-title":"Test generation and dynamic com-paction of test","author":"goel","year":"1979","journal-title":"Annu Test Conference"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090834"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144279"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2023193"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2002.994657"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/43.476580"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.54"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512661"}],"event":{"name":"2013 IEEE International Test Conference (ITC)","location":"Anaheim, CA, USA","start":{"date-parts":[[2013,9,6]]},"end":{"date-parts":[[2013,9,13]]}},"container-title":["2013 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6646057\/6651860\/06651914.pdf?arnumber=6651914","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T02:26:08Z","timestamp":1490235968000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6651914\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/test.2013.6651914","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}