{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:42:04Z","timestamp":1761648124340},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/test.2013.6651915","type":"proceedings-article","created":{"date-parts":[[2013,11,11]],"date-time":"2013-11-11T19:57:38Z","timestamp":1384199858000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["Application of under-approximation techniques to functional test generation targeting hard to detect stuck-at faults"],"prefix":"10.1109","author":[{"given":"Mahesh","family":"Prabhu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacob A.","family":"Abraham","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"0","key":"19"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-0931-7"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04772-5_40"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.13"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2012.6233016"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2010.5419843"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2036184"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1999.782022"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219068"},{"year":"0","key":"21"},{"key":"20","doi-asserted-by":"crossref","DOI":"10.1007\/3-540-48683-6_8","article-title":"Verifying safety properties of a powerpc-microprocessor using symbolic model checking without bdds","author":"biere","year":"1999","journal-title":"Proceedings of the Computer Aided Verification"},{"year":"0","key":"22"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/43.108614"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/43.536723"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1145\/277044.277201"},{"year":"0","key":"26"},{"key":"27","doi-asserted-by":"crossref","DOI":"10.1007\/3-540-45657-0_7","article-title":"Modeling and verifying systems using a logic of counter arithmetic with lambda expressions and uninterpreted functions","author":"bryant","year":"2002","journal-title":"Proceedings of the Computer Aided Verification Conference"},{"key":"3","article-title":"Native mode functional test generation for processors with applications to self test and design validation","author":"shen","year":"1998","journal-title":"Proceedings of The International Test Conference"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297676"},{"key":"1","article-title":"A logic design structure for LSI testability","author":"eichelberger","year":"1977","journal-title":"Proceedings of the Design Automation Conference"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270851"},{"journal-title":"Automatic Test Pattern Generation for Functional Register-transfer Level Circuits Using Assignment Decision Diagrams","year":"2001","author":"ghosh","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041810"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894222"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583987"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240893"}],"event":{"name":"2013 IEEE International Test Conference (ITC)","start":{"date-parts":[[2013,9,6]]},"location":"Anaheim, CA, USA","end":{"date-parts":[[2013,9,13]]}},"container-title":["2013 IEEE International Test Conference (ITC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6646057\/6651860\/06651915.pdf?arnumber=6651915","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T01:45:26Z","timestamp":1498095926000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6651915\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/test.2013.6651915","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}