{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:29:45Z","timestamp":1762252185689},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/test.2014.7035294","type":"proceedings-article","created":{"date-parts":[[2015,2,11]],"date-time":"2015-02-11T17:21:10Z","timestamp":1423675270000},"page":"1-8","source":"Crossref","is-referenced-by-count":18,"title":["Achieving extreme scan compression for SoC Designs"],"prefix":"10.1109","author":[{"given":"Peter","family":"Wohl","sequence":"first","affiliation":[]},{"given":"John A.","family":"Waicukauski","sequence":"additional","affiliation":[]},{"given":"Jonathon E.","family":"Colburn","sequence":"additional","affiliation":[]},{"given":"Milind","family":"Sonawane","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783724"},{"key":"ref11","article-title":"UltraScan: Using Time-Division Demultiplexing\/Multiplexing (TDDM\/TDM) with VirtualScan for Test Cost Reduction","author":"wang","year":"2005","journal-title":"International Test Conference"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651897"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090896"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355693"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651896"},{"journal-title":"DFTMAX","year":"0","key":"ref16"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837366"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437575"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.70"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2205385"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.834228"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2021602"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511816321"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1093\/ietisy\/e91-d.7.2008"}],"event":{"name":"2014 IEEE International Test Conference (ITC)","start":{"date-parts":[[2014,10,20]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2014,10,23]]}},"container-title":["2014 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7024668\/7035243\/07035294.pdf?arnumber=7035294","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T01:18:15Z","timestamp":1490318295000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035294\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/test.2014.7035294","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}