{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T16:53:58Z","timestamp":1725555238351},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/test.2014.7035297","type":"proceedings-article","created":{"date-parts":[[2015,2,11]],"date-time":"2015-02-11T22:21:10Z","timestamp":1423693270000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["Fast BIST of I\/O Pin AC specifications and inter-chip delays"],"prefix":"10.1109","author":[{"given":"Stephen","family":"Sunter","sequence":"first","affiliation":[]},{"given":"Saghir A.","family":"Shaikh","sequence":"additional","affiliation":[]},{"given":"Qing","family":"Lin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699207"},{"year":"0","key":"ref3","article-title":"IEEE standard test access port and boundary-scan architecture"},{"year":"2008","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271089"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2206363"},{"journal-title":"ITRS 2009","article-title":"International technology roadmap for semiconductors, 2009 Edition, Test and test equipment","year":"0","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966635"},{"key":"ref2","first-page":"1","article-title":"KGD Probing of TSVs at 40 um Array Pitch","author":"smith","year":"2010","journal-title":"Proc of lTC"},{"year":"2009","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743140"}],"event":{"name":"2014 IEEE International Test Conference (ITC)","start":{"date-parts":[[2014,10,20]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2014,10,23]]}},"container-title":["2014 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7024668\/7035243\/07035297.pdf?arnumber=7035297","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T05:18:07Z","timestamp":1490332687000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035297\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2014.7035297","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}