{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,11]],"date-time":"2025-12-11T02:58:20Z","timestamp":1765421900365},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/test.2014.7035303","type":"proceedings-article","created":{"date-parts":[[2015,2,11]],"date-time":"2015-02-11T17:21:10Z","timestamp":1423675270000},"page":"1-8","source":"Crossref","is-referenced-by-count":11,"title":["A novel RF self test for a combo SoC on digital ATE with multi-site applications"],"prefix":"10.1109","author":[{"given":"Chun-Hsien","family":"Peng","sequence":"first","affiliation":[]},{"given":"ChiaYu","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Adonis","family":"Tsu","sequence":"additional","affiliation":[]},{"given":"Chung-Jin","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Yosen","family":"Chen","sequence":"additional","affiliation":[]},{"given":"C.-Y.","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Kai","family":"Hong","sequence":"additional","affiliation":[]},{"given":"Kaipon","family":"Kao","sequence":"additional","affiliation":[]},{"given":"Paul","family":"Liang","sequence":"additional","affiliation":[]},{"given":"C.-L.","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Charles","family":"Chien","sequence":"additional","affiliation":[]},{"given":"H.-C.","family":"Hwang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.40"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139142"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2019085"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SMIC.2010.5422977"},{"key":"ref8","first-page":"793","article-title":"RF test on a mixed signal tester","author":"brown","year":"2004","journal-title":"Proc IEEE International Test Conference"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.7"},{"key":"ref2","first-page":"801","article-title":"Use of embedded sensors for builtin-test RF circuits","author":"bhattacharya","year":"2004","journal-title":"Proc IEEE International Test Conference"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583999"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297704"}],"event":{"name":"2014 IEEE International Test Conference (ITC)","start":{"date-parts":[[2014,10,20]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2014,10,23]]}},"container-title":["2014 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7024668\/7035243\/07035303.pdf?arnumber=7035303","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T20:36:54Z","timestamp":1490301414000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035303\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/test.2014.7035303","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}