{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T08:46:47Z","timestamp":1725698807693},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/test.2014.7035305","type":"proceedings-article","created":{"date-parts":[[2015,2,11]],"date-time":"2015-02-11T22:21:10Z","timestamp":1423693270000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["A built-in self-test circuit for jitter tolerance measurement in high-speed wireline receivers"],"prefix":"10.1109","author":[{"given":"Myeong-Jae","family":"Park","sequence":"first","affiliation":[]},{"given":"Jaeha","family":"Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2220502"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583976"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297721"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/4.641688"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2012.6330683"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.818569"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297722"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699175"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2008.4585993"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651882"},{"key":"ref8","article-title":"Integrated Circuit Having Receiver Jitter Tolerance (JTOL) Measurement","author":"lee","year":"2010","journal-title":"patent application"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2184378"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700624"},{"year":"0","key":"ref1","article-title":"Universal Serial Bus 3.1 Specification"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041822"}],"event":{"name":"2014 IEEE International Test Conference (ITC)","start":{"date-parts":[[2014,10,20]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2014,10,23]]}},"container-title":["2014 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7024668\/7035243\/07035305.pdf?arnumber=7035305","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T00:25:59Z","timestamp":1490315159000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035305\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/test.2014.7035305","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}