{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T17:14:38Z","timestamp":1775582078841,"version":"3.50.1"},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/test.2014.7035330","type":"proceedings-article","created":{"date-parts":[[2015,2,11]],"date-time":"2015-02-11T17:21:10Z","timestamp":1423675270000},"page":"1-2","source":"Crossref","is-referenced-by-count":20,"title":["Design and test of analog circuits towards sub-ppm level"],"prefix":"10.1109","author":[{"given":"Georges","family":"Gielen","sequence":"first","affiliation":[]},{"given":"Wim","family":"Dobbelaere","sequence":"additional","affiliation":[]},{"given":"Ronny","family":"Vanhooren","sequence":"additional","affiliation":[]},{"given":"Anthony","family":"Coyette","sequence":"additional","affiliation":[]},{"given":"Baris","family":"Esen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"Optimization of analog fault coverage by exploiting default-specific masking","author":"coyette","year":"2014","journal-title":"Proc ETS"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139127"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.92"},{"key":"ref1","article-title":"Analog fault coverage improvement using defect-specific masking","author":"dobbelaere","year":"2014","journal-title":"VOICE conference"}],"event":{"name":"2014 IEEE International Test Conference (ITC)","location":"Seattle, WA, USA","start":{"date-parts":[[2014,10,20]]},"end":{"date-parts":[[2014,10,23]]}},"container-title":["2014 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7024668\/7035243\/07035330.pdf?arnumber=7035330","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T01:18:05Z","timestamp":1490318285000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035330\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/test.2014.7035330","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}