{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:58:10Z","timestamp":1772042290852,"version":"3.50.1"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/test.2014.7035350","type":"proceedings-article","created":{"date-parts":[[2015,2,11]],"date-time":"2015-02-11T17:21:10Z","timestamp":1423675270000},"page":"1-10","source":"Crossref","is-referenced-by-count":6,"title":["Test pattern generation in presence of unknown values based on restricted symbolic logic"],"prefix":"10.1109","author":[{"given":"Dominik","family":"Erb","sequence":"first","affiliation":[]},{"given":"Karsten","family":"Scheibler","sequence":"additional","affiliation":[]},{"given":"Michael A.","family":"Kochte","sequence":"additional","affiliation":[]},{"given":"Matthias","family":"Sauer","sequence":"additional","affiliation":[]},{"given":"Hans-Joachim","family":"Wunderlich","sequence":"additional","affiliation":[]},{"given":"Bernd","family":"Becker","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2012.6233017"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2611760"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.098"},{"key":"ref13","author":"garey","year":"1979","journal-title":"Computers and Intractability A Guide to the Theory of NP-Completeness"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.108614"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2013.53"},{"key":"ref16","author":"kleene","year":"1952","journal-title":"Introduction to Metamathematics"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S1571-0661(05)82542-3"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538759"},{"key":"ref19","article-title":"Antom-solver description","author":"schubert","year":"2010","journal-title":"SAT Race"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674662"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843854"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1989.76900"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676819"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1988.122573"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1972.5008985"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674663"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.104.0278"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/EDAC.1991.206456"}],"event":{"name":"2014 IEEE International Test Conference (ITC)","location":"Seattle, WA, USA","start":{"date-parts":[[2014,10,20]]},"end":{"date-parts":[[2014,10,23]]}},"container-title":["2014 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7024668\/7035243\/07035350.pdf?arnumber=7035350","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T20:36:49Z","timestamp":1490301409000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035350\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2014.7035350","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}