{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T04:35:17Z","timestamp":1729658117780,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/test.2014.7035362","type":"proceedings-article","created":{"date-parts":[[2015,2,11]],"date-time":"2015-02-11T17:21:10Z","timestamp":1423675270000},"page":"1-8","source":"Crossref","is-referenced-by-count":3,"title":["Divide and conquer diagnosis for multiple defects"],"prefix":"10.1109","author":[{"given":"Shih-Min","family":"Chao","sequence":"first","affiliation":[]},{"given":"Po-Juei","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Jing-Yu","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Po-Hao","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Ang-Feng","family":"Lin","sequence":"additional","affiliation":[]},{"given":"James C.-M.","family":"Li","sequence":"additional","affiliation":[]},{"given":"Pei-Ying","family":"Hsueh","sequence":"additional","affiliation":[]},{"given":"Chun-Yi","family":"Kuo","sequence":"additional","affiliation":[]},{"given":"Ying-Yen","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Jih-Nung","family":"Li","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.25"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1997.643595"},{"key":"ref12","first-page":"1","article-title":"An effective and flexible multiple defect diagnosis methodology using error propagation analysis","author":"yu","year":"2008","journal-title":"Proceedings of The International Test Conference"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766647"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268829"},{"key":"ref15","first-page":"1","article-title":"Multiple-Fault Diagnosis Based on Single-Fault Activation and Single-Output Observation","author":"lin","year":"2006","journal-title":"Proc Design Automation and Test in Europe"},{"key":"ref16","first-page":"17","article-title":"On electrical fault diagnosis in full-scan circuits","author":"hora","year":"2001","journal-title":"Proc IEEE Int l Workshop on Defect Based Testing"},{"key":"ref17","first-page":"182","article-title":"Stuck-open fault diagnosis with stuck-at model","author":"fan","year":"2005","journal-title":"Proc Eur Test Symp"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"1748","DOI":"10.1109\/TCAD.2005.852457","article-title":"Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs","volume":"24","author":"li","year":"2005","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966731"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/92.285750"},{"journal-title":"Semiconductor Industry Association","article-title":"International Technology Roadmap for Semiconductors","year":"2011","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2048352"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2013.0104"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.854624"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.816206"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386963"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref9","first-page":"885","article-title":"Diagnosis of multiple arbitrary faults with mask and reinforcement effect","author":"ye","year":"2010","journal-title":"Proc Design Automation and Test in Europe"}],"event":{"name":"2014 IEEE International Test Conference (ITC)","start":{"date-parts":[[2014,10,20]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2014,10,23]]}},"container-title":["2014 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7024668\/7035243\/07035362.pdf?arnumber=7035362","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T01:21:58Z","timestamp":1498180918000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035362\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/test.2014.7035362","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}